White Light Interferometry (WLI) @ Waterford Institute of Technology (WIT) SEAM

Institution Waterford Institute of Technology (WIT) SEAM
County Waterford
Technique Category Other Techniques
Technique White Light Interferometry (WLI)

Basic Capabilities

Non-contact method for surface height measurement of 3-D structures with surface profiles varying from tens of nanometers to centimeters

Non-contact measurement of surface, Surface roughness (Ra), Step height, surface characterizations of micro electrical mechanical systems (MEMS).

 

Turnaroud Time - 1 week from receipt of sample

Equipment

Equipment Make Bruker
Equipment Model Contour GT

Advantages/Limitations

Advantage of Technique/Equipment

Quick analysis, non-contact, nm range height resolution

Limitations of Technique/Equipment Best suited to small samples and short working distances

Other Details

Containment NO
Turnaround Time Days
Report yes
Interpretation yes
Data on Analyst Experienced Staff member
Indicative Price

Industry Recommendation

Surface profilometry of a wide range of material surfaces, please contact for further details.

Contact

Dr. Ramesh Raghavendra

Quality & Systems Supports

Quality Management System in Place

Yes

Good Manufacturing Practice Status

Yes

Preventative Maintenance

Calibration standards available

Accreditation

Calibrated

Print Solution

© 2011 ATTLAS | Built by Granite Digital