White Light Interferometry (WLI) @ Waterford Institute of Technology (WIT) SEAM

Institution Waterford Institute of Technology (WIT) SEAM
County Waterford
Technique Category Other Techniques
Technique White Light Interferometry (WLI)

Basic Capabilities

Non-contact method for surface height measurement of 3-D structures with surface profiles varying from tens of nanometers to centimeters

Non-contact measurement of surface, Surface roughness (Ra), Step height, surface characterizations of micro electrical mechanical systems (MEMS).


Turnaroud Time - 1 week from receipt of sample


Equipment Make Bruker
Equipment Model Contour GT


Advantage of Technique/Equipment

Quick analysis, non-contact, nm range height resolution

Limitations of Technique/Equipment Best suited to small samples and short working distances

Other Details

Containment NO
Turnaround Time Days
Report yes
Interpretation yes
Data on Analyst Experienced Staff member
Indicative Price

Industry Recommendation

Surface profilometry of a wide range of material surfaces, please contact for further details.


Dr. Ramesh Raghavendra

Quality & Systems Supports

Quality Management System in Place


Good Manufacturing Practice Status


Preventative Maintenance

Calibration standards available



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