Scanning Electron Microscope (SEM) with EDX @ Waterford Institute of Technology (WIT) SEAM

Institution Waterford Institute of Technology (WIT) SEAM
County Waterford
Technique Category Other Techniques
Technique Scanning Electron Microscope (SEM) with EDX

Basic Capabilities

General microscopy/Variable pressure microscopy/Quantitative analysis(morphology and composition). Uses include contamination identification, discolouration, determining elemental composition, particle shape, size and distribution analysis, surface composition/contamination, topography and weathering effects.

 

Microscopy: Surface characterisations. Observation of micron to submicron particles. Elemental composition

Equipment

Equipment Make Hitachi
Equipment Model S-3000N VP

Advantages/Limitations

Advantage of Technique/Equipment

Resolution of 10 nm at 3 kV. Real time full screen image, dual image and signal mixing.

Limitations of Technique/Equipment Organic materials need to be gold coated prior to analysis to prevent charging

Other Details

Containment
Turnaround Time Days
Report no
Interpretation no
Data on Analyst
Indicative Price

Industry Recommendation

Contact

Dr. Ramesh Raghavendra

Quality & Systems Supports

Quality Management System in Place

Good Manufacturing Practice Status

Preventative Maintenance

Accreditation

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