Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) @ University of Limerick Bernal Institute (UL)

Institution University of Limerick Bernal Institute (UL)
County Limerick
Technique Category Spectroscopy
Technique Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Basic Capabilities

TOF-SIMS is a very sensitive surface analytical techique. It provides detailed elemental and molecular information about surface , thin layers and interfaces of the samples.


Equipment Make ION-TOF
Equipment Model TOF.SIMS 5


Advantage of Technique/Equipment

Very sensitive surface analytical technique

Limitations of Technique/Equipment Prior knowledge is recommended for interpretation of data

Other Details

Containment Equipment not appropriate for highly toxic samples. Fume hoods are available on a limited basis. PPE must be specified in Risk Assessment
Turnaround Time Days
Report yes
Interpretation yes
Data on Analyst Experienced staff member/technician
Indicative Price €350 per sample for 2 spectoscopy and 2 imaging measurement per sample. All others on a "by request" basis.

Industry Recommendation


Dr. Sergey Beloshapkin

Quality & Systems Supports

Quality Management System in Place

Good Manufacturing Practice Status

Preventative Maintenance

PM contract with supplier. Risk assesment must be supplied before measurement is carried out.


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