Secondary Ion Mass Spectroscopy (SIMS) @ University College Dublin (UCD)

Institution University College Dublin (UCD)
County Dublin
Technique Category Image Analysis / Microscopy
Technique Secondary Ion Mass Spectroscopy (SIMS)

Basic Capabilities

The mass/charge ratios of secondary ions are measured with a mass spectrometer to determine the elemental, isotopic, or molecular composition of the surface to a depth of 1 to 2 nm, Depth profiling can also be carried out with this instrument.

Equipment

Equipment Make Hiden Analytical
Equipment Model SIMS workstation

Advantages/Limitations

Advantage of Technique/Equipment

Excellent detection sensitivity for dopants and impurities, with ppm or lower detection sensitivity. Depth profiles with excellent detection limits and depth resolution. Small-area analysis. Detection of all elements and isotopes, including H

Limitations of Technique/Equipment Sample compatibility with UHV

Other Details

Containment
Turnaround Time Days
Report yes
Interpretation yes
Data on Analyst Experienced staff member: Dr. Ian Reid with over 10 years experience.
Indicative Price Price Available on Request: depending on turnadround and analysis type, NIMAC offers same day analysis

Industry Recommendation

Contact

Dr. Ian Reid

Quality & Systems Supports

Quality Management System in Place

Internal quality management system (SOPs, logbooks)

Good Manufacturing Practice Status

Preventative Maintenance

Accreditation

N/A

Print Solution

© 2011 ATTLAS | Built by Granite Digital