Dual Beam Focused Ion Beam (DB-FIB) @ University College Dublin (UCD)

Institution University College Dublin (UCD)
County Dublin
Technique Category Image Analysis / Microscopy
Technique Dual Beam Focused Ion Beam (DB-FIB)

Basic Capabilities

Imaging sub surface, 2D and 3D material characterization

Equipment

Equipment Make FEI Ltd, Hillsboro, USA
Equipment Model Quanta 3D FEG DualBeam

Advantages/Limitations

Advantage of Technique/Equipment

Site specific cross sections and TEM sample prep, Nano size milling and structure deposition

Limitations of Technique/Equipment Size restrictions

Other Details

Containment
Turnaround Time Days
Report yes
Interpretation yes
Data on Analyst Experienced staff member: Dr. Ian Reid with over 10 years experience.
Indicative Price Price Available on Request: depending on turnadround and analysis type, NIMAC offers same day analysis

Industry Recommendation

Contact

Dr. Ian Reid

Quality & Systems Supports

Quality Management System in Place

Good Manufacturing Practice Status

Preventative Maintenance

Accreditation

N/A

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