Focused Ion Beam (FIB) @ University College Dublin (UCD)
| Institution | University College Dublin (UCD) |
|---|---|
| County | Dublin |
| Technique Category | Image Analysis / Microscopy |
| Technique | Focused Ion Beam (FIB) |
Basic Capabilities
Imaging sub surface
Equipment
| Equipment Make | FEI Ltd, Hillsboro, USA |
|---|---|
| Equipment Model | Quanta 3D FEG DualBeam |
Advantages/Limitations
| Advantage of Technique/Equipment | High resolution Focused Ion Beam (FIB) cross sections, Quick (S)TEM sample preparation, Circuit edits for semiconductor applications, Failure Analysis technique, Milling and deposition of complex structures |
|---|---|
| Limitations of Technique/Equipment | Cross-section area is small |
Other Details
| Containment | |
|---|---|
| Turnaround Time | Days |
| Report | yes |
| Interpretation | yes |
| Data on Analyst | Experienced staff member: Dr. Ian Reid with over 10 years experience. |
| Indicative Price | Price Available on Request: depending on turnadround and analysis type, NIMAC offers same day analysis |
Industry Recommendation
Quality & Systems Supports
Quality Management System in Place
Internal quality management system (SOPs, logbooks)
Good Manufacturing Practice Status
Preventative Maintenance
Accreditation
N/A
