Focused Ion Beam (FIB) @ University College Dublin (UCD)

Institution University College Dublin (UCD)
County Dublin
Technique Category Image Analysis / Microscopy
Technique Focused Ion Beam (FIB)

Basic Capabilities

Imaging sub surface


Equipment Make FEI Ltd, Hillsboro, USA
Equipment Model Quanta 3D FEG DualBeam


Advantage of Technique/Equipment

High resolution Focused Ion Beam (FIB) cross sections, Quick (S)TEM sample preparation, Circuit edits for semiconductor applications, Failure Analysis technique, Milling and deposition of complex structures

Limitations of Technique/Equipment Cross-section area is small

Other Details

Turnaround Time Days
Report yes
Interpretation yes
Data on Analyst Experienced staff member: Dr. Ian Reid with over 10 years experience.
Indicative Price Price Available on Request: depending on turnadround and analysis type, NIMAC offers same day analysis

Industry Recommendation


Dr. Ian Reid

Quality & Systems Supports

Quality Management System in Place

Internal quality management system (SOPs, logbooks)

Good Manufacturing Practice Status

Preventative Maintenance



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