Scanning Electron Microscopy (SEM) @ NUI Maynooth

Institution NUI Maynooth
County Kildare
Technique Category Image Analysis / Microscopy
Technique Scanning Electron Microscopy (SEM)

Basic Capabilities

High-resolution sample imaging  combined with ultra-thin window Energy Dispersive X-ray (EDX) detector for qualitative/ quantitative elemental analysis. 

Equipment

Equipment Make Hitachi (SEM) , Oxford Instruments(EDX)
Equipment Model SEM: S-3200N. EDX: 51-ADD0009

Advantages/Limitations

Advantage of Technique/Equipment

"Accelerating Voltage: 0.3 to 30kV (118 steps)
Magnification: 20x to 300,000x (63 steps)
SEM Resolution: 3.5nm guaranteed.
"

Limitations of Technique/Equipment Destruction of sample. Vacuum-compatible materials only.

Other Details

Containment No
Turnaround Time Days
Report yes
Interpretation yes
Data on Analyst Experienced staff member/technician
Indicative Price €100 per hour

Industry Recommendation

Contact

Dr. Ken Maddock

Quality & Systems Supports

Quality Management System in Place

Good Manufacturing Practice Status

Preventative Maintenance

Routine internal maintenance carried out.

Accreditation

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