Scanning Electron Microscopy (SEM) @ Trinity College Dublin (TCD) CMA
| Institution | Trinity College Dublin (TCD) CMA |
|---|---|
| County | Dublin |
| Technique Category | Image Analysis / Microscopy |
| Technique | Scanning Electron Microscopy (SEM) |
Basic Capabilities
General microscopy/Variable pressure microscopy/Quantitative analysis(morphology and composition). Uses include contamination identification, discolouration, determining elemental composition, particle shape, size and distribution analysis, surface composition/contamination, topography and weathering effects.Equipment
| Equipment Make | Zeiss |
|---|---|
| Equipment Model | Supra 35VP |
Advantages/Limitations
| Advantage of Technique/Equipment | Highly efficient imaging |
|---|---|
| Limitations of Technique/Equipment | N/A |
Other Details
| Containment | |
|---|---|
| Turnaround Time | Sample Dependent |
| Report | yes |
| Interpretation | no |
| Data on Analyst | Experienced staff member/Technician |
| Indicative Price | Price Available on Request |
Industry Recommendation
Quality & Systems Supports
Quality Management System in Place
Yes
Good Manufacturing Practice Status
Preventative Maintenance
In-house calibration against standard reference materials and external calibration. Preventative maintenance contract in place
Accreditation
ISO 9001:2008
