Scanning Electron Microscopy (SEM) @ Trinity College Dublin (TCD) CMA

Institution Trinity College Dublin (TCD) CMA
County Dublin
Technique Category Image Analysis / Microscopy
Technique Scanning Electron Microscopy (SEM)

Basic Capabilities

General microscopy/Variable pressure microscopy/Quantitative analysis(morphology and composition). Uses include contamination identification, discolouration, determining elemental composition, particle shape, size and distribution analysis, surface composition/contamination, topography and weathering effects.


Equipment Make Zeiss
Equipment Model Supra 35VP


Advantage of Technique/Equipment Highly efficient imaging
Limitations of Technique/Equipment N/A

Other Details

Turnaround Time Sample Dependent
Report yes
Interpretation no
Data on Analyst Experienced staff member/Technician
Indicative Price Price Available on Request

Industry Recommendation


Mr Colin Reid

Quality & Systems Supports

Quality Management System in Place


Good Manufacturing Practice Status

Preventative Maintenance

In-house calibration against standard reference materials and external calibration. Preventative maintenance contract in place


ISO 9001:2008

Print Solution

© 2011 ATTLAS | Built by Granite Digital