Scanning Electron Microscopy (SEM). With Energy Dispresive X-Ray and Micro Tensile Tester @ Galway-Mayo Institute of Technology (GMIT)
| Institution | Galway-Mayo Institute of Technology (GMIT) |
|---|---|
| County | Galway |
| Technique Category | Mechanical Properties Analysis |
| Technique | Scanning Electron Microscopy (SEM). With Energy Dispresive X-Ray and Micro Tensile Tester |
Basic Capabilities
Images sample surface up to 20,000X magnification, elemental analysisEquipment
| Equipment Make | JEOL |
|---|---|
| Equipment Model | JEOL JSM-6490LV Scanning Electron Microscope and GATAN MICROTEST |
Advantages/Limitations
| Advantage of Technique/Equipment | N/A |
|---|---|
| Limitations of Technique/Equipment | N/A |
Other Details
| Containment | Yes |
|---|---|
| Turnaround Time | Sample Dependent |
| Report | yes |
| Interpretation | yes |
| Data on Analyst | Experienced staff member/Technician |
| Indicative Price | €100/hour |
Industry Recommendation
Quality & Systems Supports
Quality Management System in Place
N/A
Good Manufacturing Practice Status
Preventative Maintenance
Yes
Accreditation
N/A
