Scanning Electron Microscopy (SEM). With Energy Dispresive X-Ray and Micro Tensile Tester @ Galway-Mayo Institute of Technology (GMIT)

Institution Galway-Mayo Institute of Technology (GMIT)
County Galway
Technique Category Image Analysis / Microscopy
Technique Scanning Electron Microscopy (SEM). With Energy Dispresive X-Ray and Micro Tensile Tester

Basic Capabilities

Images sample surface up to 20,000X magnification, elemental analysis

Equipment

Equipment Make JEOL
Equipment Model JEOL JSM-6490LV Scanning Electron Microscope and GATAN MICROTEST

Advantages/Limitations

Advantage of Technique/Equipment N/A
Limitations of Technique/Equipment N/A

Other Details

Containment Yes
Turnaround Time Sample Dependent
Report yes
Interpretation yes
Data on Analyst Experienced staff member/Technician
Indicative Price €100/hour

Industry Recommendation

Contact

Eugene McCarthy

Quality & Systems Supports

Quality Management System in Place

N/A

Good Manufacturing Practice Status

Preventative Maintenance

Yes

Accreditation

N/A

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