Scanning Electron Microscopy (SEM) @ University of Limerick Bernal Institute (UL)

Institution University of Limerick Bernal Institute (UL)
County Limerick
Technique Category Image Analysis / Microscopy
Technique Scanning Electron Microscopy (SEM)

Basic Capabilities

Microscopy: observation of Micron to submicron particles. Elemental composition (C, O, F, etc_ qualitative not quantitative). Backscattered imaging for atomic weight contrast. Diffraction of metals/ceramics.


Equipment Make Hitachi
Equipment Model SU-70


Advantage of Technique/Equipment

Site selective compositional analysis. Only needs small amount of material (tip of microspatula). Top magnification of 800 Kx and 1 nm resolution. Voltages from 0.1-30kV

Limitations of Technique/Equipment Material needs to be vacuum compatible. Material needs to be stable under the beam. Sample can charge so low voltages or coatings may need to apply to some samples. Sample must be dry.

Other Details

Containment None. If sample is volatile, it is unsuitable for vacuum.
Turnaround Time Days
Report yes
Interpretation no
Data on Analyst Experienced staff member/technician
Indicative Price €100/sample. *Priority work is 100% surcharge.

Industry Recommendation


Dr. Vasily Lebedev / Ray O Brien


Industry Queries - Ray O Brien

Quality & Systems Supports

Quality Management System in Place


Good Manufacturing Practice Status

Preventative Maintenance

PM contract with supplier. In-house calibration against standard reference materials for EDS



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