Focused Ion Beam (FIB) @ University of Limerick Bernal Institute (UL)

Institution University of Limerick Bernal Institute (UL)
County Limerick
Technique Category Image Analysis / Microscopy
Technique Focused Ion Beam (FIB)

Basic Capabilities

Looking at subgrains by using ion beam to cut below the surface. Cross Section of materals to characterise the grain structure and layering / deposition


Equipment Make FEI
Equipment Model FIB-200


Advantage of Technique/Equipment

Site selective removal of material - useful to look at interfaces

Limitations of Technique/Equipment Material needs to be vacuum compatible. Material needs to be stable under the beam. Sample must be dry.

Other Details

Containment None. If sample is volatile, it is unsuitable for vacuum.
Turnaround Time Days
Report yes
Interpretation no
Data on Analyst Experienced staff member/technician
Indicative Price Price Available on Request

Industry Recommendation


Dr. Sergey Belochapkine / Ray O Brien


Industry Queries - Ray O Brien

Quality & Systems Supports

Quality Management System in Place


Good Manufacturing Practice Status

Preventative Maintenance

In-house PM. In-house calibration



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