Dual Beam Focused Ion Beam (DB-FIB) @ University College Dublin (UCD)

Institution University College Dublin (UCD)
County Dublin
Technique Category Image Analysis / Microscopy
Technique Dual Beam Focused Ion Beam (DB-FIB)

Basic Capabilities

Imaging sub surface, 2D and 3D material characterization


Equipment Make FEI Ltd, Hillsboro, USA
Equipment Model Quanta 3D FEG DualBeam


Advantage of Technique/Equipment Site specific cross sections and TEM sample prep, Nano size milling and structure deposition
Limitations of Technique/Equipment Size restrictions

Other Details

Containment n/a
Turnaround Time Sample Dependent
Report yes
Interpretation yes
Data on Analyst Experienced staff member/technician
Indicative Price €200-400/hr depending on turnaround and analysis type, NIMAC offers same day analysis

Industry Recommendation


Dr. Ian Reid

Quality & Systems Supports

Quality Management System in Place

Internal quality management system (SOPs, logbooks)

Good Manufacturing Practice Status

Preventative Maintenance

Service Contract



Print Solution

© 2011 ATTLAS | Built by Granite Digital