Scanning Electron Microscopy (SEM) @ Institute of Technology Tallaght Dublin (ITTD)

Institution Institute of Technology Tallaght Dublin (ITTD)
County Dublin
Technique Category Image Analysis / Microscopy
Technique Scanning Electron Microscopy (SEM)

Basic Capabilities

Microscopy: Surface characterisations. Observation of micron to submicron particles. Elemental composition (C, O, F, etc_ qualitative not quantitative). Backscattered imaging for atomic weight contrast. Diffraction of metals/ceramics.

Equipment

Equipment Make Joel
Equipment Model Joel

Advantages/Limitations

Advantage of Technique/Equipment High resolution images of particles and surfaces
Limitations of Technique/Equipment Sample destruction

Other Details

Containment NO
Turnaround Time Sample Dependent
Report yes
Interpretation yes
Data on Analyst Experienced staff member/technician
Indicative Price Price Available on Request

Industry Recommendation

Contact

Dr. Ken Carroll and Dr. Eithne Dempsey

Contact

Quality & Systems Supports

Quality Management System in Place

N/A

Good Manufacturing Practice Status

N/A

Preventative Maintenance

Preventative maintenance contract in place

Accreditation

N/A

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